Metrology
Precision in Every Detail: Welcome to G&H | Artemis’ Metrology Facility
Step into the realm of precision and innovation. Our dedicated Metrology Facility, equipped with advanced interferometers and spectrophotometers, is integral to our meticulous production of high-quality thin film coatings. It is here that we perfect the balance between spectral reflection and transmission, crafting coatings that rise to the challenges of tomorrow's optical needs.
Our Metrology Facility stands at the forefront of our operations. A testament to our dedication to accuracy, this facility empowers us to measure spectral reflection and transmission with unparalleled precision during the production of our thin film coatings.
Metrology, the science of measurement, lies at the heart of our process. With a focus on spectral reflection and transmission, our metrology unit enables us to understand the intricate behaviour of light in relation to our thin film coatings. This understanding is vital to the refinement of our products, ensuring they meet the highest standards of performance and efficiency.
At G&H | Artemis, we've invested in cutting-edge interferometers and spectrophotometers - two key instruments that form the backbone of our Metrology Facility. Our interferometers play an essential role in measuring optical wavefronts, while our spectrophotometers provide detailed analysis of spectral reflection and transmission. These technologies grant us the ability to make accurate and consistent measurements, ultimately ensuring the superior quality of our thin film coatings.
This facility is not just about achieving precise measurements; it is about using these measurements to guide our continuous improvement. The data we gather here informs our research and development, spurring on innovations that push the envelope of thin film technology.
Our metrology unit is a beacon of our commitment to precision and quality in every thin film coating we produce
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